D. Caffin

Morphological instabilities of nickel and cobalt silicides on silicon

S. Nygren, D. Caffin, Mikael Östling et al. · Applied Surface Science · 1991 · 38 citations

Materials Science, Materials Engineering, Engineering +6

Base-collector leakage currents in InP/InGaAs double heterojunction bipolar transistors

D. Caffin, A.M. Duchenois, F. Héliot et al. · IEEE Transactions on Electron Devices · 1997 · 23 citations

Materials Engineering, Materials Science, Electrical Engineering +13

Passivation of InP-based HBTs for high bit rate circuit applications

D. Caffin, L. Bricard, J.L. Courant et al. · 2002 · 16 citations

Wide-bandgap Semiconductor, Engineering, Silicon Oxide +16

InP/InGaAs double-HBT technology for high bit-ratecommunication circuits

D. Caffin, Mathilde Bouché, Mounir Meghelli et al. · Electronics Letters · 1997 · 15 citations

CBE growth of carbon doped InGaAs/InP HBTs for 25Gbit/s circuits

J.L. Benchimol, J. Mba, A.M. Duchenois et al. · Journal of Crystal Growth · 1998 · 11 citations

Electrical Engineering, Engineering, Rf Semiconductor +8