In situ site-specific specimen preparation for atom probe tomography

Keith Thompson, D. Lawrence, DJ Larson, +3

Ultramicroscopy

EngineeringElectron MicroscopyPhysicsMicroscopyScanning Probe Microscopy +5

Atom-Probe Tomography of Semiconductor Materials and Device Structures

Lincoln J. Lauhon, Praneet Adusumilli, Paul Ronsheim, +2

MRS Bulletin

SemiconductorsEngineeringElectron MicroscopyPhysicsMicroscopy +4

Toward atom probe tomography of microelectronic devices

David J. Larson, D. Lawrence, Williams Lefebvre, +11

Journal of Physics Conference Series

EngineeringMicroscopyMagnetic ResonanceIon Beam InstrumentationAtom Probe Tomography +20

Backside Lift-Out Specimen Preparation: Reversing the Analysis Direction in Atom Probe Tomography

TJ Prosa, D. Lawrence, David P. Olson, +1

Microscopy and Microanalysis

EngineeringMicroscopyAnalysis DirectionAtom Probe TomographyElectron Microscopy +17

Improved Mass Resolving Power and Yield in Atom Probe Tomography

DJ Larson, TJ Prosa, Joe Bunton, +5

Microscopy and Microanalysis

EngineeringElectron MicroscopyPhysicsMicroscopyAugust 4 +13

Developing detection efficiency standards for atom probe tomography

Ty J. Prosa, B. Geiser, D. Lawrence, +2

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

EngineeringMicroscopyMeasurementAtom Probe TomographyChemistry +18

Low-energy satellites in the X-ray fluorescence spectra of fluoro-anions

D. Lawrence, D. S. Urch

Spectrochimica Acta Part B Atomic Spectroscopy

X-ray SpectroscopyEngineeringLow-energy SatellitesSpectroscopyX-ray Diffraction +2

A Study of Parameters Affecting Atom Probe Tomography Specimen Survivability

Ty J. Prosa, S. Strennen, David P. Olson, +2

Microscopy and Microanalysis

Site-specific Lift Out Sample Preparation Technique for Atom Probe Analysis

D. Lawrence, Keith Thompson, DJ Larson, +1

Microscopy and Microanalysis

EngineeringAtomic Emission SpectroscopyMicroscopyMicroanalysis 2006Chemistry +18

Site-specific Specimen Preparation Technique for Atom Probe Analysis of Grain Boundaries

D. Lawrence, Keith Thompson, DJ Larson

Microscopy and Microanalysis

Materials ScienceAtom Probe AnalysisGrain Boundaries– August 3Physics +12