D. Lawrence

In situ site-specific specimen preparation for atom probe tomography

Keith Thompson, D. Lawrence, DJ Larson et al. · Ultramicroscopy · 2006 · 1.7K citations

Engineering, Electron Microscopy, Physics +7

Atom-Probe Tomography of Semiconductor Materials and Device Structures

Lincoln J. Lauhon, Praneet Adusumilli, Paul Ronsheim et al. · MRS Bulletin · 2009 · 45 citations

Semiconductors, Engineering, Electron Microscopy +6

Toward atom probe tomography of microelectronic devices

David J. Larson, D. Lawrence, Williams Lefebvre et al. · Journal of Physics Conference Series · 2011 · 35 citations · Full text

Engineering, Microscopy, Magnetic Resonance +22

Backside Lift-Out Specimen Preparation: Reversing the Analysis Direction in Atom Probe Tomography

TJ Prosa, D. Lawrence, David P. Olson et al. · Microscopy and Microanalysis · 2009 · 26 citations

Engineering, Microscopy, Analysis Direction +19

Improved Mass Resolving Power and Yield in Atom Probe Tomography

DJ Larson, TJ Prosa, Joe Bunton et al. · Microscopy and Microanalysis · 2013 · 19 citations · Full text

Engineering, Electron Microscopy, Physics +15