Publication | Open Access
Improved Mass Resolving Power and Yield in Atom Probe Tomography
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2013
Year
EngineeringElectron MicroscopyPhysicsMicroscopyAugust 4SpectroscopyNatural SciencesApplied PhysicsBiomedical ImagingMass Resolving PowerAtomic PhysicsMicroscopy MethodMicroanalysis– August 8Electron MicroscopeScanning Probe MicroscopyInstrumentationMicroanalysis 2013
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.