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Backside Lift-Out Specimen Preparation: Reversing the Analysis Direction in Atom Probe Tomography
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2009
Year
EngineeringMicroscopyAnalysis DirectionAtom Probe TomographyElectron MicroscopyMicroscopy MethodJuly 26Molecular ImagingBiophysicsMicroanalysis 2009Medical ImagingPhysicsAtomic PhysicsMicroanalysisMicrostructure– July 30Lift-out Specimen PreparationSpectroscopyScanning Probe MicroscopyApplied PhysicsElectron MicroscopeMedicine
Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009