Atom-Probe Tomography of Semiconductor Materials and Device Structures - Concepedia

Concepedia

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Atom-Probe Tomography of Semiconductor Materials and Device Structures

45

Citations

31

References

2009

Year

Lincoln J. Lauhon, Praneet Adusumilli, Paul Ronsheim, P. Flaitz, D. Lawrence

SemiconductorsEngineeringElectron MicroscopyPhysicsMicroscopyScanning Probe MicroscopyApplied PhysicsAtom-probe TomographyElectron Microscope

References

	Year	Citations

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