K. Hama

Analysis of hot-carrier-induced degradation mode on pMOSFET's

F. Matsuoka, Hiroshi Iwai, H. Hayashida et al. · IEEE Transactions on Electron Devices · 1990 · 67 citations

Buried-channel Pmosfets, Electrical Engineering, Engineering +15

Interface state generation under long-term positive-bias temperature stress for a p/sup +/ poly gate MOS structure

Y. Hiruta, Hiroshi Iwai, F. Matsuoka et al. · IEEE Transactions on Electron Devices · 1989 · 34 citations

Semiconductor Technology, Electrical Engineering, Semiconductor Device +14

Electromigration reliability for a tungsten-filled via hole structure

F. Matsuoka, Hiroshi Iwai, K. Hama et al. · IEEE Transactions on Electron Devices · 1990 · 28 citations

Materials Engineering, Materials Science, Electrical Engineering +12

Drain avalanche hot hole injection mode on PMOSFETs

F. Matsuoka, H. Hayashida, K. Hama et al. · 2003 · 20 citations

Semiconductor Technology, Buried-channel Pmosfets, Electrical Engineering +13

A highly reliable metal-to-metal antifuse for high-speed field programmable gate arrays

M.T. Takagi, I. Yoshii, N. Ikeda et al. · 2002 · 12 citations

Hardware Security, Electrical Engineering, Antifuse Dielectric +12