S. Crain

A compendium of recent optocoupler radiation test data

Kenneth A. LaBel, S.D. Kniffin, Robert A. Reed et al. · 2002 · 39 citations · Full text

Radiation Testing, Single Event Transients, Total Ionizing Dose +14

Single event transient (SET) sensitivity of radiation hardened and COTS voltage comparators

R. Koga, S. Crain, K.B. Crawford et al. · 2002 · 35 citations

Electrical Engineering, Engineering, Radiation Detection +11

Current radiation issues for programmable elements and devices

R. Katz, J.J. Wang, R. Koga et al. · IEEE Transactions on Nuclear Science · 1998 · 35 citations

Engineering, Vlsi Design, Electronic Design +19

Permanent single event functional interrupts (SEFIs) in 128- and 256-megabit synchronous dynamic random access memories (SDRAMs)

R. Koga, P. Yu, K.B. Crawford et al. · 2002 · 30 citations

Hardware Security, Affected Devices, Write Functions +11

SEE sensitivities of selected advanced flash and first-in-first-out memories

R. Koga, V. Tran, J. George et al. · 2005 · 30 citations

Non-volatile Memory, Engineering, Computer Architecture +17