W. A. Pliskin - Concepedia

Author

W. A. Pliskin

IBM (United States)

Also Known As

Pliskin, W. A., W. A. PLISKIN, W. A. Pliskin, W.A Pliskin, W.A. Pliskin, William A. Pliskin

Publications

Citations

H-Index

Concepts

All Affiliations

IBM (United States)Poughkeepsie Public Library District Beacon College IBM Research - Thomas J. Watson Research Center

About

W. A. Pliskin is an author at IBM (United States) specializing in engineering, applied physics, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	18	23	2.4K
2	Applied Physics	15	18	1.8K
3	Natural Sciences	5	5	607
4	Medicine	3	3	174
5	Biostatistics	2	2	399

W. A. Pliskin

Publications

2.4K

Citations

H-Index

Page 1

	Year	Citations
Comparison of properties of dielectric films deposited by various methods W. A. Pliskin Journal of Vacuum Science and Technology Thin Film PhysicsDielectricsEngineeringGlass MaterialThin Film Process Technology	1977	484
Structural Evaluation of Silicon Oxide Films W. A. Pliskin, H. Lehman Journal of The Electrochemical Society Materials EngineeringMaterials ScienceChemical EngineeringEngineeringOxide Electronics	1965	349
The Effect of Surface Coverage on the Spectra of Chemisorbed CO. R. P. Eischens, S. A. Francis, W. A. Pliskin The Journal of Physical Chemistry EngineeringChemical AnalysisAltmetric Attention ScoreSurface CoverageChemistry	1956	346
Surface Oxidation of Silicon Nitride Films S. I. Raider, R. Flitsch, J. A. Aboaf, Journal of The Electrochemical Society Materials ScienceSi 2PEngineeringOxidation ResistanceSurface Science	1976	245
Infrared Spectra of Chemisorbed Carbon Monoxide R. P. Eischens, W. A. Pliskin, S. A. Francis The Journal of Chemical Physics Inorganic ChemistryChemical EngineeringEngineeringChemical AnalysisNatural Sciences	1954	193
Stabilization of SiO<sub>2</sub> Passivation Layers with P<sub>2</sub>O<sub>5</sub> D. R. Kerr, J. S. Logan, P. J. Burkhardt, IBM Journal of Research and Development SemiconductorsNpn Silicon TransistorsElectrical EngineeringSemiconductor TechnologyEngineering	1964	121
Nondestructive Determination of Thickness and Refractive Index of Transparent Films W. A. Pliskin, Edward E. Conrad IBM Journal of Research and Development Optical MaterialsEngineeringMicroscopyOptic DesignOptical Glass	1964	111
Evidence for Oxidation Growth at the Oxide-Silicon Interface from Controlled Etch Studies W. A. Pliskin, R. P. Gnall Journal of The Electrochemical Society Electrical EngineeringControlled Etch StudiesEngineeringOxidation ResistanceOxide Electronics	1964	82
The evaluation of thin film insulators W. A. Pliskin Thin Solid Films Thermal InsulationElectrical EngineeringEngineeringApplied PhysicsThin Films	1968	54
Refractive Index of SiO2 Films Grown on Silicon W. A. Pliskin, R. P. Esch Journal of Applied Physics Thin Film PhysicsOptical MaterialsEngineeringOptical TestingThin Film Process Technology	1965	53

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