Concepedia

R. Flitsch

RF

Statistics

Publications

13

Citations

1.2K

H-Index

12

Active since

1971

Affiliations

IBM (United States)(Current)

IBM Research - Thomas J. Watson Research Center

R. Flitsch is an author at IBM (United States) specializing in materials science, natural sciences, and materials engineering.

Publications per year

1971–1996

13

Publications

13

Electron mean escape depths from x−ray photoelectron spectra of thermally oxidized silicon dioxide films on silicon

R. Flitsch, S. I. Raider · Journal of Vacuum Science and Technology · 1975 · 258 citations

, , +17

Surface Oxidation of Silicon Nitride Films

S. I. Raider, R. Flitsch, J. A. Aboaf et al. · Journal of The Electrochemical Society · 1976 · 249 citations

, , +17

Oxide Growth on Etched Silicon in Air at Room Temperature

S. I. Raider, R. Flitsch, Maghmood Palmer · Journal of The Electrochemical Society · 1975 · 217 citations

, , +17

X-Ray Photoelectron Spectroscopy of SiO <sub>2</sub> -Si Interfacial Regions: Ultrathin Oxide Films

S. I. Raider, R. Flitsch · IBM Journal of Research and Development · 1978 · 103 citations

, , +17

A study of modified polyimide surfaces as related to adhesion

R. Flitsch, D‐Y. Shih · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1990 · 72 citations

, , +17

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