T. Zettler

In situ measurements of strains and stresses in GaN heteroepitaxy and its impact on growth temperature

A. Dadgar, F. Schulze, T. Zettler et al. · Journal of Crystal Growth · 2004 · 41 citations

Materials Science, Wide-bandgap Semiconductor, Situ Measurements +6

Investigation of roughened silicon surfaces using fractal analysis. II. Chemical etching, rapid thermal chemical vapor deposition, and thermal oxidation

L. Spanos, Q. Liu, E. A. Irene et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1994 · 32 citations

Engineering, Microscopy, Mechanical Engineering +19

Grating-assisted Raman scattering of plasmons in layered two-dimensional electron systems

T. Zettler, C. R. Peters, J. P. Kotthaus et al. · Physical review. B, Condensed matter · 1989 · 30 citations

Transient Grating, Optical Materials, Engineering +19

Temperature dependence of the optical response: Application to bulk GaAs using first-principles molecular dynamics simulations

Z. A. Ibrahim, A. Shkrebtii, M. J. G. Lee et al. · Physical Review B · 2008 · 28 citations · Full text

Processes of quantum dot formation in the InAs on GaAs(001) system: A reflectance anisotropy spectroscopy study

D.I. Westwood, Z. Sobiesierski, C. C. Matthai et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1998 · 23 citations

Optical Materials, Engineering, Optoelectronic Devices +16