R. Ferguson

Measurement-Based Variational Quantum Eigensolver

R. Ferguson, Luca Dellantonio, Abdulrahim Al Balushi et al. · Physical Review Letters · 2021 · 82 citations · Full text

Natural Sciences, Computer Science, Physics +13

A high performance 0.13 μm SOI CMOS technology with Cu interconnects and low-k BEOL dielectric

P. Smeys, V. McGahay, Insoon Yang et al. · 2002 · 24 citations

Engineering, Computer Engineering, Electrical Engineering +17

Gas-source molecular beam epitaxy of SiGe virtual substrates: I. Growth kinetics and doping

Jean-Michel Hartmann, Bruno Gallas, R. Ferguson et al. · Semiconductor Science and Technology · 2000 · 22 citations

Engineering, Materials Engineering, Materials Science +17

Effect of temperature on the transfer characteristic of a 0.5 μm-gate Si:SiGe depletion-mode n-MODFET

V. Gaspari, Kristel Fobelets, J.E. Velázquez-Pérez et al. · Applied Surface Science · 2003 · 17 citations

Engineering, Electrical Engineering, Microelectronics +12

A high performance 0.13 μm SOI CMOS technology with a 70 nm silicon film and with a second generation low-k Cu BEOL

J.W. Sleight, P. Varekamp, N. Lustig et al. · 2002 · 10 citations

Engineering, Computer Engineering, Electrical Engineering +17