O. Penzin

MOSFET degradation kinetics and its simulation

O. Penzin, A. Haggag, William E. McMahon et al. · IEEE Transactions on Electron Devices · 2003 · 65 citations

Device Modeling, Electrical Engineering, Semiconductor Device +14

Exploring the limits of stress-enhanced hole mobility

Lee Smith, Victor Moroz, Geert Eneman et al. · IEEE Electron Device Letters · 2005 · 61 citations

Engineering, Residual Stress, Semiconductor Device +17

Random dopant fluctuation modelling with the impedance field method

Andreas Wettstein, O. Penzin, E. Lyumkis et al. · 2003 · 52 citations

Device Modeling, Random Dopant Fluctuations, Electrical Engineering +15

Kinetic Velocity Model to Account for Ballistic Effects in the Drift-Diffusion Transport Approach

O. Penzin, Lee Smith, A. Erlebach et al. · IEEE Transactions on Electron Devices · 2017 · 28 citations

Ballistic Effects, Engineering, Fluid Mechanics +23

14 nm FinFET Stress Engineering with Epitaxial SiGe Source/Drain

Munkang Choi, Victor Moroz, Lee Smith et al. · 2012 · 26 citations

3D Ic Architecture, Electrical Engineering, Physical Design (Electronics) +15