O. Vatel - Concepedia

Concepedia

Author

O. Vatel

NTT Basic Research Laboratories

Also Known As

O Vatel, O. Vatel, Olivier Vatel

14

Publications

1.5K

Citations

9

H-Index

42

Concepts

All Affiliations

NTT Basic Research Laboratories Centre National de la Recherche Scientifique IMEC

OV

About

O. Vatel is an author at NTT Basic Research Laboratories specializing in engineering, applied physics, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	9	9	1.5K
2	Applied Physics	9	9	1.5K
3	Medicine	1	1	56
4	Natural Sciences	1	1	98
5	Chemistry	1	1	46

O. Vatel

×

9

Publications

1.5K

Citations

9

H-Index

	Year	Citations
Self-organized growth of regular nanometer-scale InAs dots on GaAs J. M. Moison, F. Houzay, F. Barthe, Applied Physics Letters Materials ScienceSemiconductorsStrained StructuresEpitaxial GrowthEngineering	1994	927
Kelvin probe force microscopy for potential distribution measurement of semiconductor devices O. Vatel, Masafumi Tanimoto Journal of Applied Physics EngineeringMicroscopyContact ResistanceSemiconductorsSemiconductor Devices	1995	127
Kelvin probe force microscopy for characterization of semiconductor devices and processes Masafumi Tanimoto, O. Vatel Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena Aluminium NitrideEngineeringMicroscopyLateral Impurity ProfileSemiconductors	1996	108
Silicon roughness induced by plasma etching R. Petri, Pascal Brault, O. Vatel, Journal of Applied Physics EngineeringPlasma PhysicsSingle-crystal Silicon RoughnessSilicon On InsulatorPlasma Processing	1994	106
Quantitative Microroughness Analysis down to the Nanometer Scale Philippe Dumas, B Bouffakhreddine, Claude Amra, Europhysics Letters (EPL) Cross CharacterizationsAfm MeasurementsEngineeringMeasurementMicroscopy	1993	98
Nanometer-scale imaging of potential profiles in optically excited <i>n</i>-<i>i</i>-<i>p</i>-<i>i</i> heterostructure using Kelvin probe force microscopy Arturo Chavez-Pirson, O. Vatel, M. Tanimoto, Applied Physics Letters EngineeringMicroscopyNanometer-scale ImagingSemiconductor NanostructuresIi-vi Semiconductor	1995	56
Surface reconstruction of hydrogen annealed (100) silicon H. Bender, Steven Verhaverbeke, Matty Caymax, Journal of Applied Physics Materials ScienceSurface CharacterizationEngineeringStrained MonohydridesCrystalline Defects	1994	46
Atomic Force Microscopy and Infrared Spectroscopy Studies of Hydrogen Baked Si Surfaces O. Vatel, Steven Verhaverbeke, H. Bender, Japanese Journal of Applied Physics Atomic Force MicroscopyEngineeringMicroscopySilicon On InsulatorSurface Terraces	1993	23
Roughness Assessment of Polysilicon Using Power Spectral Density O. Vatel, Philippe Dumas, Frederic Chollet, Japanese Journal of Applied Physics Atomic Force MicroscopyEngineeringMicroscopyMechanical EngineeringHardness	1993	16

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