W. Krull

Ultra-shallow junction formation by B18H22 ion implantation

Yoji Kawasaki, T. Kuroi, Takashi Yamashita et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2005 · 43 citations

Engineering, Materials Engineering, Materials Science +10

Reduction of charge trappings and electron tunneling in SIMOX by supplemental implantation of oxygen

Robert E. Stahlbush, H.L. Hughes, W. Krull · IEEE Transactions on Nuclear Science · 1993 · 40 citations

Engineering, Materials Engineering, Materials Science +17

Demonstration of the benefits of SOI for high temperature operation

W. Krull, J.C. Lee · 2003 · 32 citations

Engineering, Computer Engineering, Electrical Engineering +14

Determination of the fixed oxide charge and interface trap densities for buried oxide layers formed by oxygen implantation

F.T. Brady, S. S. Li, D.E. Burk et al. · Applied Physics Letters · 1988 · 29 citations

Engineering, Electrical Engineering, Materials Science +17

Neutron irradiation effects on AlGaAs/GaAs heterojunction bipolar transistors

G.A. Schrantz, N. W. van Vonno, W. Krull et al. · IEEE Transactions on Nuclear Science · 1988 · 26 citations

Engineering, Electrical Engineering, Materials Science +17