N. W. van Vonno - Concepedia

Author

N. W. van Vonno

Intersil (United States)

Also Known As

N. W. Van Vonno, N. W. van Vonno, N.W. Van Vonno, N.W. van Vonno, Nick W. van Vonno

Publications

318

Citations

H-Index

Concepts

All Affiliations

Intersil (United States)

About

N. W. van Vonno is an author at Intersil (United States) specializing in electrical engineering, engineering, and single event effects.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	7	7	118
2	Computer Engineering	3	3	47
3	Medicine	2	2	28
4	Applied Physics	2	2	36
5	Education	1	1	12

N. W. van Vonno

Publications

128

Citations

H-Index

Page 1

	Year	Citations
Neutron irradiation effects on AlGaAs/GaAs heterojunction bipolar transistors G.A. Schrantz, N. W. van Vonno, W. Krull, IEEE Transactions on Nuclear Science SemiconductorsSemiconductor TechnologyElectrical EngineeringEngineeringTunneling-assisted Trapping	1988	26
Total Dose and Single Event Testing of a Hardened Point of Load Regulator N. W. van Vonno, L. G. Pearce, Jagbir Gill, Electrical EngineeringEngineeringTotal DoseVoltage RegulatorLoad Regulator	2010	23
Total Dose and Single Event Testing of a Hardened Single-Ended Current Mode PWM Controller N. W. van Vonno, L. G. Pearce, George M. Wood, Electrical EngineeringEngineeringSubmicron BicmosTotal DoseSingle Event Testing	2010	18
Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA Martha V. O'Bryan, Kenneth A. LaBel, Jonathan A. Pellish, EngineeringRadiation EffectRadiation ExposureTest ResultsSpace System	2010	18
Total Dose and Single Event Testing of the Intersil ISL75051SRH Low Dropout Regulator N. W. van Vonno, L. W. Pearce, K. Knudsen, Electrical EngineeringEngineeringMeasurementTotal DoseSingle Event Testing	2012	12
Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter Yingyu Ren, Lingling Fan, Li Chen, Journal of Electronic Testing Electrical EngineeringEngineeringPower IcSingle-event Effects AnalysisMixed-signal Integrated Circuit	2012	11
Total Dose and Single Event Effects Testing of the Intersil ISL71090SEH and ISL71091SEH Precision Voltage References N. W. van Vonno, B. Williams, S. D. Turner,	2014	10
Freeze-out characterization of radiation hardened N/sup +/ polysilicon gate CMOS transistors Dimitris Pantelakis, D. Hemmenway, N. W. van Vonno, IEEE Transactions on Nuclear Science Electrical EngineeringIon ImplantationEngineeringFreeze-out BehaviorMedicine	1991	10

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