Total Dose and Single Event Testing of the Intersil ISL75051SRH Low Dropout Regulator - Concepedia

Concepedia

Publication | Closed Access

Total Dose and Single Event Testing of the Intersil ISL75051SRH Low Dropout Regulator

12

Citations

2

References

2012

Year

N. W. van Vonno, L. W. Pearce, K. Knudsen, E. J. Thomson, T. M. Bernard, P. J. Chesley

Unknown Venue

Electrical EngineeringEngineeringMeasurementTotal DoseSingle Event TestingSingle Event EffectsEducationFabrication ProcessInstrumentationMicroelectronicsSee TestingElectrical Specifications

Abstract

We report the results of low and high dose rate total dose and SEE testing of the Intersil ISL75051SRH low dropout regulator together with a discussion of the part's electrical specifications and wafer fabrication process.

References

	Year	Citations

Page 1