Edmund Banghart

A model for charge transfer in buried-channel charge-coupled devices at low temperature

Edmund Banghart, James P. Lavine, Eugene A. Trabka et al. · IEEE Transactions on Electron Devices · 1991 · 41 citations

Engineering, Electrical Engineering, Physics +17

Design Optimization and Modeling of Charge Trap Transistors (CTTs) in 14 nm FinFET Technologies

Faraz Khan, Min Han, D. Moy et al. · IEEE Electron Device Letters · 2019 · 22 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +17

Influence of stress induced CT local layout effect (LLE) on 14nm FinFET

Pei Zhao, Shesh Mani Pandey, Edmund Banghart et al. · 2017 · 14 citations

Engineering, Electrical Engineering, Electronic Materials +12

The effect of potential obstacles on charge transfer in image sensors

James P. Lavine, Edmund Banghart · IEEE Transactions on Electron Devices · 1997 · 13 citations

Engineering, Electrical Engineering, Physics +17

Extension of the open-circuit voltage decay technique to include plasma-induced bandgap narrowing

Edmund Banghart, J.L. Gray · IEEE Transactions on Electron Devices · 1992 · 12 citations

Engineering, Electrical Engineering, Microelectronics +14