James P. Lavine - Concepedia

Author

James P. Lavine

Kodak (United States)

Also Known As

J P Lavine, J. -P. Lavine, J. P. Lavine, J.P Lavine, J.P. Lavine, James P Lavine, James P. Lavine, Lavine, James P.

105

Publications

687

Citations

H-Index

Concepts

All Affiliations

Kodak (United States)Carestream (United States)Eastman Chemical Company (United States)University of Rochester University of Liège

About

James P. Lavine is an author at Kodak (United States) specializing in engineering, applied physics, and physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	13	18	460
2	Applied Physics	12	14	330
3	Natural Sciences	6	6	81
4	Chemical Engineering	1	1	13
5	Chemistry	1	1	13

James P. Lavine

Publications

521

Citations

H-Index

Page 1

	Year	Citations
The pinned photodiode for an interline-transfer CCD image sensor B.C. Burkey, W.-C. Chang, J. Littlehale, Electrical EngineeringInterline-transfer CcdEngineeringPhotoelectric SensorHigh Charge Capacity	1984	73
Steady-state photocarrier collection in silicon imaging devices James P. Lavine, Eugene A. Trabka, B.C. Burkey, IEEE Transactions on Electron Devices Imaging Site DiffuseEngineeringSolid-state ImagersComputational IlluminationImage Sensor	1983	48
A model for charge transfer in buried-channel charge-coupled devices at low temperature Edmund Banghart, James P. Lavine, Eugene A. Trabka, IEEE Transactions on Electron Devices Categoryquantum ElectronicsEngineeringCharge TransferPtsi Schottky BarrierCascade Theory	1991	41
Phosphorus diffusion in polycrystalline silicon D. L. Losee, James P. Lavine, Eugene A. Trabka, Journal of Applied Physics Materials ScienceSpecific-gravity MeasurementsSecondary-ion Mass SpectroscopyCrystalline DefectsEngineering	1984	30
Monte Carlo simulation of the photoelectron crosstalk in silicon imaging devices James P. Lavine, Win-Chyi Chang, C. Anagnostopoulos, IEEE Transactions on Electron Devices EngineeringMonte Carlo MethodsSolid-state ImagersReflect Minority CarriersImage Sensor	1985	30
Probing Metal Defects in CCD Image Sensors W. C. McColgin, James P. Lavine, Charles V. Stancampiano MRS Proceedings Photoelectric SensorEngineeringSensorsCcd Image SensorsApplied Physics	1995	30
An analytical, aperture, and two-layer carrier diffusion MTF and quantum efficiency model for solid-state image sensors Eric Stevens, James P. Lavine IEEE Transactions on Electron Devices Categoryquantum ElectronicsPixel ResponseEngineeringSolid-state Image SensorsCharge Transport	1994	28
Latch-up and image crosstalk suppression by internal gettering C. Anagnostopoulos, Edward T. Nelson, James P. Lavine, IEEE Transactions on Electron Devices EngineeringOptical Wireless CommunicationIntegrated CircuitsInterference CancellationInterconnect (Integrated Circuits)	1984	26
The effect of rapid thermal annealing on the precipitation of oxygen in silicon G. A. Hawkins, James P. Lavine Journal of Applied Physics Materials ScienceHeat PulsesSolid SolubilityEngineeringPhysics	1989	24
Calculated moments for the implantation of boron into silicides Linda J. Parkes, James P. Lavine Journal of Applied Physics Projected RangeIon ImplantationEngineeringNuclear PhysicsPhysics	1986	23

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