Concepedia

A. Balasiński

AB

16

Publications

384

Citations

12

H-Index

1986

Active since

Affiliations

Yale University(Current)

Cypress Semiconductor Corporation (United States)

Cypress Semiconductor Corporation (Japan)

Sequoia (United States)

University of Warsaw

A. Balasiński is an author at Yale University specializing in engineering, electrical engineering, and microelectronics.

Top concepts

EngineeringApplied PhysicsElectrical EngineeringMicroelectronicsDevice ModelingComputer EngineeringSingle Event EffectsOptoelectronicsRadiation EffectsElectronic Engineering

Publications per year

1986–2004

16

Publications

16

Lateral profiling of oxide charge and interface traps near MOSFET junctions

W. Chen, A. Balasiński, T.P. Ma · IEEE Transactions on Electron Devices · 1993 · 102 citations

Device Modeling, Electrical Engineering, Semiconductor Device +11

Optimization of sub-100-nm designs for mask cost reduction

A. Balasiński · Journal of Micro/Nanolithography MEMS and MOEMS · 2004 · 34 citations

Engineering, Electron-beam Lithography, Transistor Performance +17

Series resistance in a MOS capacitor with a thin gate oxide

K. Iniewski, A. Balasiński, B. Majkusiak et al. · Solid-State Electronics · 1989 · 27 citations

Electrical Engineering, Mos Capacitor, Engineering +5

Ionizing radiation damage near CMOS transistor channel edges

A. Balasiński, T.P. Ma · IEEE Transactions on Nuclear Science · 1992 · 26 citations

Engineering, Radiation Effect, Radiation Exposure +17

Effects of X-ray irradiation on GIDL in MOSFETs

A. Acovic, Ching-Fang Hsu, L. C. Hsia et al. · IEEE Electron Device Letters · 1992 · 26 citations

Electrical Engineering, X-ray Irradiation, Engineering +9

Rows per page

1–5 of 16