L. C. Hsia

Determination of Raman Phonon Strain Shift Coefficient of Strained Silicon and Strained SiGe

Lydia Helena Wong, C.C. Wong, J. P. Liu et al. · Japanese Journal of Applied Physics · 2005 · 51 citations

Engineering, Materials Engineering, Materials Science +17

Adhesion study of low-k/Si system using 4-point bending and nanoscratch test

M. Damayanti, J. Widodo, Thirumany Sritharan et al. · Materials Science and Engineering B · 2005 · 41 citations

Natural Sciences, Materials Engineering, Materials Science +17

Strain relaxation in transistor channels with embedded epitaxial silicon germanium source/drain

J. P. Liu, K. Li, Shesh Mani Pandey et al. · Applied Physics Letters · 2008 · 36 citations

Engineering, Electrical Engineering, Materials Science +11

In-Depth Electrical Analysis to Reveal the Failure Mechanisms With Nanoprobing

S.L. Toh, P.K. Tan, Y.W. Goh et al. · IEEE Transactions on Device and Materials Reliability · 2008 · 27 citations

Engineering, Computer Engineering, Electrical Engineering +17

Effects of X-ray irradiation on GIDL in MOSFETs

A. Acovic, Ching-Fang Hsu, L. C. Hsia et al. · IEEE Electron Device Letters · 1992 · 26 citations

Engineering, Electrical Engineering, Radiation Physics +14