R.E. Proano

Nucleation mechanisms and the elimination of misfit dislocations at mismatched interfaces by reduction in growth area

Eugene A. Fitzgerald, G. P. Watson, R.E. Proano et al. · Journal of Applied Physics · 1989 · 309 citations

Engineering, Severe Plastic Deformation, Defect Tolerance +19

Development and electrical properties of undoped polycrystalline silicon thin-film transistors

R.E. Proano, R.S. Misage, D. G. Ast · IEEE Transactions on Electron Devices · 1989 · 247 citations

Semiconductors, Electrical Engineering, Electronic Devices +14

Elimination of interface defects in mismatched epilayers by a reduction in growth area

Eugene A. Fitzgerald, P. D. Kirchner, R.E. Proano et al. · Applied Physics Letters · 1988 · 84 citations

Semiconductors, Materials Science, Epitaxial Growth +13

Effects of the presence/absence of HCl during gate oxidation on the electrical and structural properties of polycrystalline silicon thin-film transistors

R.E. Proano, D. G. Ast · Journal of Applied Physics · 1989 · 65 citations

Materials Science, Semiconductor Technology, Electrical Engineering +12

Guest-host active matrix liquid-crystal display using high-voltage polysilicon thin-film transistors

R.E. Proano, R.S. Misage, Derick Jones et al. · IEEE Transactions on Electron Devices · 1991 · 17 citations

Semiconductor Technology, Electrical Engineering, Electronic Devices +12