D. P. Tracy

Correlation of texture with electromigration behavior in Al metallization

D. B. Knorr, D. P. Tracy, Kenneth P. Rodbell · Applied Physics Letters · 1991 · 136 citations

Materials Science, Materials Engineering, Electromigration Technique +15

Texture and microstructure of thin copper films

D. P. Tracy, D. B. Knorr · Journal of Electronic Materials · 1993 · 121 citations

Materials Science, Engineering, Surface Science +5

Texture in multilayer metallization structures

D. P. Tracy, D. B. Knorr, Kenneth P. Rodbell · Journal of Applied Physics · 1994 · 111 citations

Materials Science, Materials Engineering, Normal Grain Growth +14

Crystallographic texture change during abnormal grain growth in Cu-Co thin films

J. M. E. Harper, J. Gupta, D. A. Smith et al. · Applied Physics Letters · 1994 · 39 citations

Engineering, Severe Plastic Deformation, Crystal Growth Technology +20

Texture Effects on the Electromigration Behavior of Layered Ti/AlCu/Ti Films

K. P. Rodbell, D. B. Knorr, D. P. Tracy · MRS Proceedings · 1992 · 19 citations

Materials Engineering, Materials Science, Texture Effects +8