Johannes Bihr

Electron-beam-based photomask repair

Klaus Edinger, Hans Becht, Johannes Bihr et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2004 · 78 citations

Materials Science, Photonics, Electrical Engineering +15

High resolution positron-annihilation spectroscopy with a new positron microprobe

Helmut Greif, M. Haaks, Uwe Holzwarth et al. · Applied Physics Letters · 1997 · 42 citations

Materials Science, Fatigue Damage Distribution, Engineering +15

A comparison between microsectioning studies of low-temperature self-diffusion in silver

Johannes Bihr, H. Mehrer, K. Maier · physica status solidi (a) · 1978 · 27 citations

Engineering, Low-temperature Self-diffusion, Chemical Deposition +17

New Detection System for GEMINI

Michael Dieter Gerhard Steigerwald, Rainer Arnold, Johannes Bihr et al. · Microscopy and Microanalysis · 2004 · 25 citations

Biology, Microanalysis 2004, New Detection System +14

Microanalysis in the EM 902: Tests on a new TEM for ESI and EELS

Wilhelm J. Egle, A. Rilk, Johannes Bihr et al. · Proceedings annual meeting Electron Microscopy Society of America · 1984 · 21 citations

Engineering, Microscopy, Elemental Mapping +22