New Detection System for GEMINI

Michael Dieter Gerhard Steigerwald, Rainer Arnold, Johannes Bihr, Volker Drexel, Heiner Jaksch, D. Preikszas, Jan P Vermeulen

Microscopy and Microanalysis · 2004 · 25 citations · 0 references

Concepts

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.