A. V. Kauppila

Impact of Process Variations on SRAM Single Event Upsets

A. V. Kauppila, B. L. Bhuva, J. S. Kauppila et al. · IEEE Transactions on Nuclear Science · 2011 · 37 citations

Hardware Security, Process Variations, Non-volatile Memory +12

Circuit-Level Layout-Aware Single-Event Sensitive-Area Analysis of 40-nm Bulk CMOS Flip-Flops Using Compact Modeling

J. S. Kauppila, Timothy D. Haeffner, Dennis R. Ball et al. · IEEE Transactions on Nuclear Science · 2011 · 29 citations

Hardware Security, Electrical Engineering, Single-event Upset +12

Impact of Process Variations and Charge Sharing on the Single-Event-Upset Response of Flip-Flops

A. V. Kauppila, B. L. Bhuva, L. W. Massengill et al. · IEEE Transactions on Nuclear Science · 2011 · 27 citations

Hardware Security, Process Variations, Electrical Engineering +11

Effect of Negative Bias Temperature Instability on the Single Event Upset Response of 40 nm Flip-Flops

A. V. Kauppila, B. L. Bhuva, T. D. Loveless et al. · IEEE Transactions on Nuclear Science · 2012 · 17 citations

Electrical Engineering, Nm Flip-flops, Vlsi Design +12

Single event Simulation methodology for analog/mixed signal design hardening

J. S. Kauppila, L. W. Massengill, W.T. Holman et al. · IEEE Transactions on Nuclear Science · 2004 · 14 citations

Hardware Security, Analog/mixed Signal Circuits, Reliability Engineering +15