Microscopy Microanalysis Microstructures

Scanning force microscopy - With Applications to Electric, Magnetic and Atomic Forces

Dror Sarid, R. Coratger, F. Ajustron et al. · 1991 · 565 citations · Full text

Engineering, Electrical Engineering, Physics +17

Microscope imaging by time-of-flight secondary ion mass spectrometry

B. Schueler · 1992 · 216 citations · Full text

Natural Sciences, Chemistry, Analytical Chemistry +13

Design and first applications of a post-column imaging filter

Ondrej L. Krivanek, A.J. Gubbens, Niklas Dellby et al. · 1992 · 140 citations · Full text

Natural Sciences, Chemistry, Optics +14

The parameterless correction method in X-ray microanalysis

Éric Van Cappellen · 1990 · 131 citations · Full text

Natural Sciences, Chemistry, Analytical Chemistry +11

Developments in EELS instrumentation for spectroscopy and imaging

Ondrej L. Krivanek, A.J. Gubbens, Niklas Dellby · 1991 · 122 citations · Full text

Natural Sciences, Materials Science, Elemental Analysis +16