Scanning force microscopy - With Applications to Electric, Magnetic and Atomic Forces

Abstract

PART ONE: LEVERS AND NOISE 1. Mechanical properties of levers 2. Resonance enhancement 3. Sources of noise PART TWO: SCANNING FORCE MICROSCOPES 4. Tunneling detection systems 5. Capacitance detection systems 6. Homodyne detection systems 7. Heterodyne detection systems 8. Laser-Diode feedback detection systems 9. Polarization detection systems 10. Deflection detection systems PART THREE: SCANNING FORCE MICROSCOPY 11. Electric force microscopy 12. Magnetic force microscopy 13. Atomic force microscopy References Index