Characterization and model of temperature effect on the conducted immunity of Op-Amp

Operational amplifier input stage robust to EMI

Franco Fiori · Electronics Letters · 2001 · 35 citations

Engineering, Electrical Engineering, Analog Electronics +13

Design of a folded cascode opamp with increased immunity to conducted electromagnetic interference in 0.18μm CMOS

Anna Richelli, Gilbert Matig-a, Jean‐Michel Redouté · Microelectronics Reliability · 2015 · 20 citations

Engineering, Electrical Engineering, Analog Electronics +14

Control of the electromagnetic compatibility: An issue for IC reliability

Jean-Baptiste Gros, Geneviève Duchamp, Jean-Luc Levant et al. · Microelectronics Reliability · 2011 · 14 citations

Engineering, Computer Engineering, Electrical Engineering +13

Thermal Influence on 16-Bits Microcontroller Emission

Sonia Ben Dhia, Étienne Sicard, Y. Mequignon et al. · 2007 · 14 citations

Engineering, Computer Engineering, Electrical Engineering +17

Conducted immunity of three Op-Amps using the DPI measurement technique and VHDL-AMS modeling

Siham Hairoud, Tristan Dubois, Angélique Tetelin et al. · 2013 · 12 citations

Engineering, Computer Engineering, Electrical Engineering +17