Conducted Immunity Testing is a type of electromagnetic compatibility validation that assesses a device's ability to maintain intended performance when subjected to unwanted conducted electrical energy introduced via its cables or conductive pathways.
35
Publications
599
Citations
118
Authors
51
Institutions
Publications per year
2017–2026
8
Publications
35
Generic IC EMC Test Specification
Thomas Steinecke, Michael Bischoff, Frank Brandl et al. · 2012 · 32 citations
1–5 of 35
Authors
118
- GD
4
h-index
- RP
3
h-index
- MR
3
h-index
- TD
3
h-index
- MS
2
h-index
1–5 of 118
Institutions
51
Universitat Politècnica de Catalunya
Barcelona, Spain
3 h-index
8 publications
94 citations
Université de Bordeaux
Bordeaux, France
3 h-index
12 publications
147 citations
École Supérieure d'Électronique de l'Ouest
Angers, France
3 h-index
8 publications
161 citations
Institut d'Électronique et des Technologies du numéRique
Rennes, France
3 h-index
5 publications
105 citations
Institut Polytechnique de Bordeaux
Bordeaux, France
3 h-index
11 publications
138 citations
Laboratoire de l'Intégration du Matériau au Système
Talence, France
2 h-index
8 publications
99 citations
Institut National des Sciences Appliquées de Rennes
Rennes, France
2 h-index
2 publications
45 citations
University of Strathclyde
Glasgow, United Kingdom
2 h-index
4 publications
46 citations
1–8 of 51
Venues
- IEEE Transactions on Electromagnetic Compatibility
8 publications · 181 citations
8
h-index
- Microelectronics Reliability
2 publications · 25 citations
2
h-index
- IEEE Transactions on Instrumentation and Measurement
1 publications · 23 citations
1
h-index
- IEEE Transactions on Power Delivery
1 publications · 11 citations
1
h-index
- IEICE Transactions on Communications
1 publications · 34 citations
1
h-index
1–5