Dynamics of annular bright field imaging in scanning transmission electron microscopy

Scott D. Findlay, Naoya Shibata, Hidetaka Sawada, +3

Ultramicroscopy

Light Field ImagingEngineeringElectron MicroscopyTransmission Electron MicroscopyMicroscopy +8

A 6.6-kV Transformerless STATCOM Based on a Five-Level Diode-Clamped PWM Converter: System Design and Experimentation of a 200-V 10-kVA Laboratory Model

Hirofumi Akagi, Hideaki Fujita, Shinsuke Yonetani, +1

IEEE Transactions on Industry Applications

Electrical EngineeringEngineeringUtility Distribution SystemsElectrical DrivePower Electronics Converter +7

Five-Level Diode-Clamped PWM Converters Connected Back-to-Back for Motor Drives

Natchpong Hatti, Yosuke Kondo, Hirofumi Akagi

IEEE Transactions on Industry Applications

Electrical EngineeringMedium-voltage Motor DriveEngineeringSplit Dc CapacitorsMotor Drive +8

Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun

Takeo Sasaki, Hidetaka Sawada, F. Hosokawa, +7

Journal of Electron Microscopy

Correction of higher order geometrical aberration by triple 3-fold astigmatism field

Hidetaka Sawada, Takeo Sasaki, F. Hosokawa, +8

Journal of Electron Microscopy

EngineeringMicroscopyOptic DesignElectron OpticCalibration +15

Quantitative high-resolution microscopy on a suspended chain of gold atoms

Hiroaki Koizumi, Yoshifumi Oshima, Yosuke Kondo, +1

Ultramicroscopy

PhysicsMicroscopyNanotechnologySpectroscopyNatural Sciences +9

A 6.6-kV transformerless STATCOM based on a five-level diode-clamped PWM converter: system design and experimentation of a 200-V, 10-kVA laboratory model

Hirofumi Akagi, Hideaki Fujita, Shinsuke Yonetani, +1

Fourtieth IAS Annual Meeting. Conference Record of the 2005 Industry Applications Conference, 2005.

10-Kva Laboratory ModelElectrical EngineeringIndustrial ElectronicsEngineeringSmart Grid +10

Atomic Resolution Elemental Map of EELS with a Cs Corrected STEM

Eiji Okunishi, Hidetaka Sawada, Yosuke Kondo, +1

Microscopy and Microanalysis

EngineeringMicroscopyMicroanalysis 2006ChemistryElectron Microscopy +14

Simultaneous measurements of conductivity and magnetism by using microprobes and electron holography

Yasukazu Murakami, Naoyuki Kawamoto, Daisuke Shindo, +6

Applied Physics Letters

EngineeringTransmission Electron MicroscopyMicroscopyMagnetic ResonanceMagnetic Field +22

Simulation of Bulk Current Injection Test for Automotive Components Using Electromagnetic Analysis

Yosuke Kondo, Masato Izumichi, Osami Wada

IEEE Transactions on Electromagnetic Compatibility

Electrical EngineeringEngineeringBulk Current InjectionAntennaTransmission Line +4