Visualization of Light Elements at Ultrahigh Resolution by STEM Annular Bright Field Microscopy

Eiji Okunishi, Isamu Ishikawa, Hidetaka Sawada, +3

Microscopy and Microanalysis

EngineeringMicroscopyLight ElementsMicroscopy MethodLight Microscopy +16

STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun

Hidetaka Sawada, Y. Tanishiro, Naoki Ohashi, +5

Journal of Electron Microscopy

Dumbbell ImageEngineeringMicroscopyElectron DiffractionPm Spacing +14

Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun

Takeo Sasaki, Hidetaka Sawada, F. Hosokawa, +7

Journal of Electron Microscopy

Measurement method of aberration from Ronchigram by autocorrelation function

Hidetaka Sawada, Takumi Sannomiya, F. Hosokawa, +8

Ultramicroscopy

EngineeringMeasurementCalibrationInterferometryEducation +5

Correction of higher order geometrical aberration by triple 3-fold astigmatism field

Hidetaka Sawada, Takeo Sasaki, F. Hosokawa, +8

Journal of Electron Microscopy

EngineeringMicroscopyOptic DesignElectron OpticCalibration +15

Atomic-Resolution STEM Imaging of Graphene at Low Voltage of 30 kV with Resolution Enhancement by Using Large Convergence Angle

Hidetaka Sawada, Takeo Sasaki, F. Hosokawa, +1

Physical Review Letters

EngineeringMicroscopyAberration CorrectionLow Accelerating VoltageElectron Optic +18

Higher-order aberration corrector for an image-forming system in a transmission electron microscope

Hidetaka Sawada, Takeo Sasaki, F. Hosokawa, +8

Ultramicroscopy

EngineeringElectron MicroscopyPhysicsMicroscopyOptical Properties +11

Ferroelectric Properties in Polyamides of m-Xylylenediamine and Dicarboxylic Acids

Yukinobu Murata, Kenji Tsunashima, Naokazu Koizumi, +3

Japanese Journal of Applied Physics

Materials ScienceElectroactive MaterialConducting PolymerEngineeringFerroelectric Application +11

A spherical aberration-corrected 200 kV TEM

F. Hosokawa

Journal of Electron Microscopy

Optical MaterialsEngineeringMicroscopyOptic DesignOptical Testing +14

Electron microscopy at a sub-50 pm resolution

K. Takayanagi, S. Kim, S. Lee, +8

Microscopy

Materials ScienceEngineeringElectron MicroscopyPhysicsMicroscopy +13