Concepedia

F. Hosokawa

FH

10

Publications

821

Citations

10

H-Index

1993

Active since

Affiliations

JEOL (Japan)(Current)

Japan Science and Technology Agency

National Institute of Advanced Industrial Science and Technology

Tokyo Institute of Technology

National Institute for Materials Science

F. Hosokawa is an author at JEOL (Japan) specializing in engineering, microscopy, and physics.

Top concepts

EngineeringMicroscopyPhysicsApplied PhysicsInstrumentationMedicineOphthalmologyMaterial ScienceComputational ImagingSynchrotron Radiation

Publications per year

1993–2015

10

Publications

10

Visualization of Light Elements at Ultrahigh Resolution by STEM Annular Bright Field Microscopy

Eiji Okunishi, Isamu Ishikawa, Hidetaka Sawada et al. · Microscopy and Microanalysis · 2009 · 199 citations

Engineering, Microscopy, Light Elements +18

STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun

Hidetaka Sawada, Y. Tanishiro, Naoki Ohashi et al. · Journal of Electron Microscopy · 2009 · 170 citations

Dumbbell Image, Engineering, Microscopy +16

Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun

Takeo Sasaki, Hidetaka Sawada, F. Hosokawa et al. · Journal of Electron Microscopy · 2010 · 102 citations

Measurement method of aberration from Ronchigram by autocorrelation function

Hidetaka Sawada, Takumi Sannomiya, F. Hosokawa et al. · Ultramicroscopy · 2008 · 87 citations

Engineering, Measurement, Calibration +7

Correction of higher order geometrical aberration by triple 3-fold astigmatism field

Hidetaka Sawada, Takeo Sasaki, F. Hosokawa et al. · Journal of Electron Microscopy · 2009 · 76 citations

Engineering, Microscopy, Optic Design +17

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