Conducted immunity of three Op-Amps using the DPI measurement technique and VHDL-AMS modeling

Abstract

This paper presents an application of the ICIM-CI model to the prediction of the susceptibility of ICs (Integrated Circuits) to environmental disturbances in avionic boards. The method is illustrated by the obsolescence study of three commercial operational amplifiers (Op-Amps) showing quasi-identical electrical characteristics and pin-to-pin compatibility, through the comparison of their respective conducted immunities. The model is developed in VHDL-AMS language, and the simulation results are validated through comparison with Direct Power Injection measurements.