Temperature-dependent direct transition energy in Ge0.99Sn0.01 film grown on Si measured by photoreflectance spectroscopy - Concepedia

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Temperature-dependent direct transition energy in Ge0.99Sn0.01 film grown on Si measured by photoreflectance spectroscopy

15

Citations

28

References

2015

Year

Hyun-Jun Jo, Mo Geun So, Jong Su Kim, Mee‐Yi Ryu, Y. K. Yeo, John Kouvetakis

Thin Solid Films

Materials ScienceEngineeringPhysicsCondensed Matter PhysicsApplied PhysicsPhotoreflectance SpectroscopySemiconductor MaterialThin FilmsSilicon On InsulatorEpitaxial GrowthOptoelectronicsGe0.99sn0.01 Film Grown

References

	Year	Citations

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