International Test Conference · 1981 · 64 citations · 0 references
EngineeringComputer EngineeringElectrical EngineeringFault-tolerant ComputingMicroelectronicsVlsi DesignBuilt-in Self-testCmos Circuit DesignDesign For TestabilityFault InjectionAutomatic Test Pattern GenerationCmos ReliabilityStuck-at Fault TestingTest Data GenerationTest GenerationVlsi Implementation