Superlattices and Microstructures · 2015 · 58 citations · 26 references
Electrical EngineeringEngineeringBias Temperature InstabilityApplied PhysicsOxide/source OverlapSemiconductor Device
26
Double-Gate Tunnel FET With High- Gate Dielectric
Kathy Boucart, Adrian Ionescu · IEEE Transactions on Electron Devices · 2007 · 1.6K citations · Full text
The electronic structure at the atomic scale of ultrathin gate oxides
David A. Muller, T. Sorsch, S. Moccio et al. · Nature · 1999 · 955 citations
Silicon surface tunnel transistor
William Michael Reddick, G.A.J. Amaratunga · Applied Physics Letters · 1995 · 365 citations