Concepedia
Microelectronics Reliability · 2015 · 14 citations · 6 references
Device ModelingElectrical EngineeringEngineeringBias Temperature InstabilityElectronic PackagingPower ElectronicsMicroelectronicsCircuit AnalysisCircuit Simulation
6
Industrial Electronics
Nature · 1936 · 326 citations · Full text
An experimentally verified IGBT model implemented in the Saber circuit simulator
Allen R. Hefner, D.M. Diebolt · IEEE Transactions on Power Electronics · 1994 · 304 citations
Device Modeling, Verified Igbt Model, Electrical Engineering +14
Microelectronics reliability
J. Wayne Meredith · 2003 · 296 citations
Reliability, Reliability Goals, Electrical Engineering +15
Physics-Based SPICE-Model for IGBTs With Transparent Emitter
M. Cotorogea · IEEE Transactions on Power Electronics · 2009 · 43 citations
Engineering, Power Electronic Systems, Integrated Circuits +17
Analysis of the UIS behavior of power devices by means of SPICE-based electrothermal simulations
Vincenzo d’Alessandro, Alessandro Magnani, Michele Riccio et al. · Microelectronics Reliability · 2013 · 33 citations
Device Modeling, Electrical Engineering, Engineering +13