Journal of Materials Chemistry C · 2023 · 18 citations · 14 references
Natural SciencesMaterials SciencePhysicsMaterials PhysicsSolid State PhysicsThin FilmsAmorphous MaterialsAmorphous SolidsAtomic Layer DepositionThin Film AnnealingThin Film Electrical PropertiesThin-film MaterialsAmorphous Oxide SemiconductorsAmorphous Thin FilmsAnnealing EffectsAnnealing Temperature EffectsElectrical PropertiesPost-deposition AnnealingThermal StabilityThin Oxide Films
This study investigated the crystallization and electrical properties of atomic layer deposited Zn–Sn–O (ZTO) thin films. Sn 42 at% ZTO thin film showed the best thermal stability and electrical properties due to a change in the sub-gap states.
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Trap densities in amorphous-InGaZnO4 thin-film transistors
Mutsumi Kimura, Takashi Nakanishi, Kenji Nomura et al. · Applied Physics Letters · 2008 · 317 citations