Concepedia

Novel Transient-Fault Detection Circuit Featuring Enhanced Bulk Built-in Current Sensor with Low-Power Sleep Mode

Rodrigo Possamai Bastos, Frank Sill Torres, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre

HAL (Le Centre pour la Communication Scientifique Directe) · 2012 · 16 citations · 8 references

Concepts

EngineeringComputer EngineeringElectrical EngineeringLow-power DesignMicroelectronicsSemiconductor DevicesCurrent-voltage CharacteristicsFault DetectionFault DiagnosisHardware Fault ToleranceLeakage Power ReductionSensor DiagnosticsCircuit Transient AnalysisCurrent SensingCurrent Sensing CircuitsCurrent SensorsSensor Fault DetectionSensor Fault DiagnosisTransient Detection

Abstract

International audience

References

8

Leakage current: Moore's law meets static power

N.S. Kim, T. Austin, Trevor Mudge et al. · Computer · 2003 · 1.2K citations

Engineering, Computer Engineering, Electrical Engineering +13

Characterization of soft errors caused by single event upsets in CMOS processes

Tanay Karnik, P. Hazucha · IEEE Transactions on Dependable and Secure Computing · 2004 · 540 citations

Engineering, Computer Engineering, Electrical Engineering +17

Statistical Analysis of the Charge Collected in SOI and Bulk Devices Under Heavy lon and Proton Irradiation—Implications for Digital SETs

V. Ferlet-Cavrois, Philippe Paillet, Marc Gaillardin et al. · IEEE Transactions on Nuclear Science · 2006 · 153 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +17

Using Bulk Built-in Current Sensors to Detect Soft Errors

Egas Henes Neto, Igor Daniel Alves Ribeiro, Michele O. Vieira et al. · IEEE Micro · 2006 · 121 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +17

SEU-tolerant SRAM design based on current monitoring

Fabian Vargas, M. Nicolaidis · 2002 · 116 citations

Engineering, Computer Engineering, Electrical Engineering +17