2002 · 87 citations · 3 references
EngineeringComputer EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesDevice CharacterizationDevice ReliabilityDigital Integrated Circuit DesignReliability ModelingReliable System DesignSemiconductor ReliabilityCmos ReliabilityDigital Device OperationGate Oxide DegradationGate Oxide ReliabilityOxide BreakdownOxide ReliabilityReliability Degradation MechanismsWear-out Mechanisms
We demonstrate that many gate oxide breakdowns can occur in parts of a digital circuit without affecting its overall logical function. This implies that if maintaining the circuit's logical functionality is the sufficient reliability criterion, the present reliability specifications are excessively stringent.
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Gate oxide breakdown under Current Limited Constant Voltage Stress
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