Microelectronics Reliability · 1972 · 105 citations · 0 references
EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesSemiconductor MaterialsCurrent-voltage CharacteristicsDevice ModelingElectric CircuitsField-effect TransistorsIntegrated Circuit DesignMetal-oxide-semiconductor Field-effect TransistorsCurrentsGate DielectricsGate Oxide LeakageGate-dependent Current-voltage BehaviorInsulated-gate Field-effect Transistors