Measurement · 2020 · 15 citations · 41 references
Natural SciencesMaterials EngineeringMaterials ScienceNanomaterialsNanotechnologyThin FilmsAtomic Force MicroscopyNanomaterial CharacterizationNanomechanicsPolymer Thin FilmsScanning Probe MicroscopyThin Film Surface MorphologyAtomic Force Microscopy MetrologyAtomic Force Microscopy Surface AnalysisForce SpectroscopyMicroscale Force MeasurementStress MeasurementThin Film Surface CharacterizationTip-sample Adhesion
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Method for the calibration of atomic force microscope cantilevers
John E. Sader, Ian Larson, Paul Mulvaney et al. · Review of Scientific Instruments · 1995 · 983 citations
Friction laws at the nanoscale
Yifei Mo, Kevin T. Turner, Izabela Szlufarska · Nature · 2009 · 918 citations