Concepedia

SIGMA: A Set-up for In-situ Growth, Material modification and Analysis by ion beams

K. Kantre, Marcos V. Moro, Dmitrii Moldarev, David Johansson, D. Wessman, Max Wolff, Daniel Primetzhofer

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2019 · 19 citations · 27 references

DOI

Concepts

References

27

The surface science of titanium dioxide

Ulrike Diebold · Surface Science Reports · 2003 · 7.8K citations

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SIMNRA, a simulation program for the analysis of NRA, RBS and ERDA

M. Mayer · AIP conference proceedings · 1999 · 963 citations

, , +15

Oxidation of Polycrystalline Copper Thin Films at Ambient Conditions

Ilia Platzman, R. Brener, Hossam Haick et al. · The Journal of Physical Chemistry C · 2008 · 903 citations

, , +17

Physical mechanisms of transient enhanced dopant diffusion in ion-implanted silicon

P.A. Stolk, H.‐J. Gossmann, D. J. Eaglesham et al. · Journal of Applied Physics · 1997 · 619 citations

, , +17

Surface X-Ray Scattering during Crystal Growth: Ge on Ge(111)

Elias Vlieg, A. W. Denier van der Gon, J. F. van der Veen et al. · Physical Review Letters · 1988 · 159 citations

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