Microelectronic Engineering · 2019 · 34 citations · 34 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsAluminum OxidesMos CapacitorsSemiconductor Device MaterialsSemiconductor InterfacesSemiconductor SurfacesThin Film AnnealingAnnealing EffectsAnnealing Temperature EffectsAnnealing Time Effects
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High dielectric constant oxides
John Robertson · The European Physical Journal Applied Physics · 2004 · 1.8K citations · Full text
Masataka Higashiwaki, Kohei Sasaki, Takafumi Kamimura et al. · Applied Physics Letters · 2013 · 719 citations