Concepedia

Publication | Closed Access

Influence of post-deposition annealing on characteristics of Pt/Al2O3/β-Ga2O3 MOS capacitors

DOI

29

Citations

34

References

2019

Year

Masafumi Hirose, Toshihide Nabatame, Kazuya Yuge, Erika Maeda, Akihiko Ohi, Naoki Ikeda, Yoshihiro Irokawa, Hideo Iwaï, Hideyuki Yasufuku, Satoshi Kawada,
Microelectronic Engineering

References

YearCitations

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