Influence of post-deposition annealing on characteristics of Pt/Al2O3/β-Ga2O3 MOS capacitors

Masafumi Hirose, Toshihide Nabatame, Kazuya Yuge, Erika Maeda, Akihiko Ohi, Naoki Ikeda, Yoshihiro Irokawa, Hideo Iwaï, Hideyuki Yasufuku, Satoshi Kawada,

Microelectronic Engineering · 2019 · 34 citations · 34 references

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