Test Methodology & Neutron Characterization of Xilinx 16nm Zynq® UltraScale+™ Multi-Processor System-on-Chip (MPSoC)

Abstract

This paper presents a test methodology using Xilinx System Validation Tool (SVT) design suite to characterize the single event response of Xilinx's 16nm Zynq Ultrascale+ MPSoC dual & quad ARM core processors. Accelerated SEU beam test of a XCZU9EG device was performed using the 64MeV Proton source at Crocker Nuclear Laboratory (CNL). Single-event characterization results are presented and categorized in terms of detectability and correctability. SEU test results show that the overall Processor System (PS) FIT FIT is ≤ 1, with all safety mechanisms enabled and no uncorrectable events were observed in the PS RAM.