Failure analysis of 650 V enhancement mode GaN HEMT after short circuit tests - Concepedia

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Failure analysis of 650 V enhancement mode GaN HEMT after short circuit tests

23

Citations

10

References

2018

Year

C. Abbate, G. Busatto, A. Sanseverino, D. Tedesco, F. Velardi

Microelectronics Reliability

Electrical EngineeringEngineeringShort Circuit TestsPower Semiconductor DeviceFailure AnalysisGan Power DevicePower Electronics

References

	Year	Citations

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