Nanotechnology · 2018 · 47 citations · 26 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesSemiconductor MaterialsDevice CharacterizationDevice ScalingMemory DevicesSemiconductor Device MaterialsThin Film Thermal PropertiesThin-film MaterialsAtomic SizeCrossbar SwitchingEnduranceHigh-speed SwitchingRandom-access MemoryResistive Random-access MemorySwitching DevicesThermal Stability
Abstract In this letter, we demonstrate a new binary ovonic threshold switching (OTS) selector device scalable down to ø30 nm based on C–Te. Our proposed selector device exhibits outstanding performance such as a high switching ratio (I on /I off > 10 5 ), an extremely low off-current (∼1 nA), an extremely fast operating speed of <10 ns (transition time of <2 ns and delay time of <8 ns), high endurance (10 9 ), and high thermal stability (>450 °C). The observed high thermal stability is caused by the relatively small atomic size of C, compared to Te, which can effectively suppress the segregation and crystallization of Te in the OTS film. Furthermore, to confirm the functionality of the selector in a crossbar array, we evaluated a 1S-1R device by integrating our OTS device with a ReRAM (resistive random access memory) device. The 1S-1R integrated device exhibits a successful suppression of leakage current at the half-selected cell and shows an excellent read-out margin (>2 12 word lines) in a fast read operation.
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Complementary resistive switches for passive nanocrossbar memories
Eike Linn, R. Rosezin, C. Kügeler et al. · Nature Materials · 2010 · 1.3K citations
A map for phase-change materials
Dominic Lencer, Martin Salinga, Blazej Grabowski et al. · Nature Materials · 2008 · 744 citations
Natural Sciences, Materials Engineering, Materials Science +12