Endurance prediction and error Reduction in NAND flash using machine learning

Barry Fitzgerald, Damien Hogan, Conor Ryan, Joe Sullivan

2017 · 13 citations · 7 references

Concepts

Abstract

The following topics are dealt with: random-access storage; integrated circuit modelling; magnetic tunnelling; MRAM devices; chalcogenide glasses; neural nets; hafnium compounds; thermal stability; integrated circuit design; resistive RAM.

References

7