Microelectronics Reliability · 2017 · 15 citations · 17 references
Electrical EngineeringSolid-state LightingEngineeringHardware ReliabilityAdvanced Packaging (Semiconductors)Thermal Transient MeasurementNew Lighting TechnologyComputer EngineeringThermal ModelingFlip-chip Led ModuleHeat TransferElectronic PackagingMicroelectronicsThermal EngineeringPower Electronics
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Light emitting diodes reliability review
Moon‐Hwan Chang, Diganta Das, P. V. Varde et al. · Microelectronics Reliability · 2011 · 746 citations
Reliability, Electrical Engineering, Reliability Engineering +7
A new evaluation method of thermal transient measurement results
V. Székely · Microelectronics Journal · 1997 · 423 citations