Publication | Closed Access
Impact of the gate stack on the electrical performances of 3D multi-channel MOSFET (MCFET) on SOI
13
Citations
4
References
2008
Year
Gate StackElectrical Engineering3D Ic ArchitectureEngineeringVlsi DesignAdvanced Packaging (Semiconductors)Bias Temperature InstabilityMulti-channel MosfetElectrical PerformancesMicroelectronics
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