The construction and evaluation of behavioral models for microwave devices based on time-domain large-signal measurements

Abstract

We present a new procedure for creating nonlinear behavioral models of microwave devices, based on techniques developed in time-series analysis. We illustrate this procedure by creating a model for a HEMT device. Large-signal time-domain microwave measurements are used to generate the time-series data of the terminal currents and voltages. The dynamical model of the HEMT is defined by fitting multivariate polynomials to the terminal voltages and their higher-order derivatives. The model accurately predicts DC, small-signal, and large-signal behavior.